Lateral force microscopy (LFM) is derived from contact mode imaging. In contact mode, when the cantilever probe is scanned over the entire surface, the resulting image is obtained by changing the position of the sample during scanning and the difference in the frictional force experienced by the needle tip (the "twist" of the needle tip). Lateral scanning (perpendicular to The cantilever of its length) is subjected to greater torsional force when passing through high friction parts, and the torque of low friction parts tends to decrease. The relative measure of the lateral forces encountered along the surface can be plotted against high and low friction points.